OmniVision and Artilux Announce Collaboration on NIR 3D Imaging and More
OmniVision, an industry leading developer of high performance CMOS image sensor solutions, and Artilux, the pioneer of wide spectrum 3D sensing technology based on GeSi photonics, jointly announced their execution of a formal letter of intent to collaborate in the field of CMOS image sensors and GeSi based 3D sensors, after a series of evaluation and analysis.
Unfolding New Dimensions of CMOS SWIR Imaging
Artilux, the pioneer of wide spectrum 3D sensing technology based on GeSi photonics, announced today the world’s first single-chip CMOS-based GeSi imager for a compact dual-mode (2D/3D) SWIR (Shortwave Infrared) sensing & imaging system. The high-resolution GeSi imager is fabricated at TSMC 12-inch CMOS production line, and is ready for commercialization at scale, enabling an ever-growing ecosystem to mark the beginning of SWIR sensing and imaging for consumer markets.
Artilux Launches Next-gen Sensing Technology with High Gain and Low Noise Performance for Automotive Applications
Artilux, the renowned leader in CMOS SWIR optical sensing technology and GeSi (Germanium Silicon) photonics technology today announced Germanium-Silicon Avalanche Photodiode (GeSi APD) array technology, the next-gen 3D imaging and sensing technology that achieves the unique high gain and low dark current with mature CMOS-based production. When being used with Optical Phased Array (OPA) technology, an optimal Solid-State LiDAR system will be implemented to improve sensing and to truly fulfill the affordable safety in autonomous driving.